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An infrared line scanning technique has been used to measure thermal conductivities of TiO2, Ta2O5, ZrO2, HfO2, A12O3 and SiO2 layers. Damage thresholds are determined using a two stage Nd:Yag laser with pulse length of 14ns and spot size of 300μ. A correlation between thermal conductivity, absorption coefficient, melting point and damage threshold is established. To explain the relation, theoretical models based on absorption and inclusion breakdown are analysed.

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